一、課程說明(Course Description)
<br>The purpose of this course is to provide students fundamental knowledge of
<br>essential crystallography and X-ray diffraction theory.  The experimental 
<br>techniques of X-ray diffraction and their applications in determination of 
<br>crystal structure, lattice parameters, chemical compositions and residual 
<br>stress will also be covered. 
<br>
<br> 二、指定用書(Text Books)
<br>
<br>B.D. Cullity and S.R. Stock," Elements of X-ray Diffraction", 3rd edition, Prentice Hall, 2001
<br>
<br>
<br> 三、參考書籍(References)
<br>
<br>1. D. Mckie and C. Mckie, "Essentials of Crystallography", Blackwell Scientific Publications, 1986
<br>2. M. M. Woolfson, “An Introduction to X-Ray Crystallography”, Cambridge University Press, 1970
<br>3. 余樹楨，"晶體之結構與性質"，渤海堂文化公司，1989.
<br>
<br> 四、教學方式(Teaching Method)
<br>
<br>Lectures
<br>
<br> 五、教學進度
<br>
<br>1.Properties of X-rays – Tex Ch1
<br>2.Essential Crystallography – Tex Ch2; Ref 1 Ch1-4; Ref 2 Ch1; Ref 3 Ch1-6
<br>(1) Crystal lattices; (2) Crystal symmetry; (3) Stereographic projection 
<br>
<br>Midterm I 
<br>
<br>3.X-ray Diffraction Theory – Tex Ch3-4;Ref 1 Ch6; Ref 2 Ch2-3,6 
<br>(1) Scattering of X-rays; (2) Bragg’s law; (3) Reciprocal space and reciprocal lattices; 
<br>(4) Diffraction from a crystal – structure-factor calculations; (5) Factors affecting X-ray intensities 
<br>
<br>Midterm II 
<br>
<br>4.X-ray Experimental Methods – Tex Ch6-8; Ref 1 Ch7-8; Ref 2 Ch5 
<br>(1) Diffractometer measurement; (2) Powder photographs; (3) Laue photographs 
<br>5.X-ray Diffraction Applications – Tex Ch10, 12-15 
<br>(1) Determination of crystal structure; (2) Measurement of lattice parameters; (3) Chemical analysis; (4) Crystal size analysis; (5) Measurement of residual stress
<br>
<br>Final Exam 
<br>
<br> 六、成績考核(Evaluation)
<br>
<br>Quiz 20%
<br>Midterm (x2) 50%
<br>Final 30 %
<br>
<br> 七、可連結之網頁位址
<br>
<br>
<br>
<br>