參考書籍：無
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<br>課程說明：預期從不同光源的方向代入下列技術介紹。期中前為技術原理介紹，期中後為聚焦離子束
<br>(Focused ion beam)、電子顯微鏡(transmission electron microscopy)實體操作課與業界實
<br>例。
<br>
<br>預期提到之相關技術：
<br>X射線光電子能譜(X-Ray Photoelectron Spectroscopy)
<br>X射線繞射分析(X-Ray Diffraction)
<br>三維X射線檢測(3D X-Ray Microscopy)
<br>小角度散射X射線散射(Small Angle X-Ray Scattering)
<br>原子力顯微鏡 (Atomic Force Microscopy)
<br>光學顯微鏡(Optical Microscopy)
<br>歐傑電子能譜 (Auger electron spectroscopy)
<br>白光干涉儀(White Light Interferometry)
<br>傅立葉轉換紅外線光譜(Fourier Transform Infrared Spectroscopy )
<br>共軛焦顯微鏡（Confocal Microscopy）
<br>二次離子質譜分析 (Secondary Ion Mass Spectroscopy)
<br>超音波掃描顯微鏡(Scanning Acoustic Tomography)
<br>掃描式電子顯微鏡(Scanning Electron Microscopy)
<br>穿透式電子顯微鏡(Transmission Electron Microscopy)
<br>掃描穿透式電子顯微鏡(Scanning Transmission Electron Microscopy)
<br>電子能量損失能譜(Electron Energy Loss Spectroscopy)
<br>能量色散X射線能譜(Energy-dispersive X-ray spectroscopy)
<br>聚焦電子束繞射(Convergent Beam Electron Diffraction)
<br>低能量電子繞射(Low Energy Electron Diffraction)
<br>背向散射電子繞射(Electron Back Scatter Diffraction）
<br>電子斷層掃描(Electron Tomography)
<br>原子探針技術(Atom Probe Tomography)
<br>
<br>成績考核：筆考(詳細方式待定)