1. 課程說明(Course Description):
It is well known that thin films are widely used in the electronic industry.
Due to the trend
on miniaturization of electronic devices, nanosclae electronic devices are
needed and the
technology and reliability of thin films have recently attracted increasing
attentions. This
course will focuses on the science and process of thin films, and reliability
science for thin
film application in the electronic industry. The topics will cover:
- Fundamental topic in thin-film process: deposition, surface energy and atomic
diffusion
- Application of diffusion equations (Fick’s first law and Fick’s second law)
- Theoretical and practical understanding of electronic thin-film reliability:
metallurgical
reaction, electromigration, thermomigration and stressmigration


2.指定用書(Text Books):
*"Electronic Thin-Film Reliability", King-Ning Tu, Cambridge University
Press, 2010,
ISBN 978-0-521- 51613-6.
*“Solder Joint Technology, Materials, properties and reliability", King-
Ning Tu, Springer,
2007, ISBN 10:0-387-38890-7.

3. 參考書籍(References)
* “Flip chip technologies”John H. Lau, McGraw-Hill, 1996.
*“Electronic Packaging, Design, Materials, Process, and Reliability” John
Lau, C.P.
Wong, John L. Prince, and Wataru Nakayama, McGraw-Hill.
*“Principles of Electronic Packaging”Donald P. Seraphim, Ronald C. Lasky,
Che-yu Li,
McGraw-Hill, 1993.
* Fundamentals of Microsystems Packaging, R.R. Tummala, McGrawHill,2001
* 微電子材料與製程,陳力俊主編中國材料科學學會 2000
* “Microelectronics packaging handbook” R.R. Tummala and E.J. Rymaszewski,
Van
Nostrand Reinhold, 1989.

4. 教學方式(Teaching Method):
* 3 hours of lecture per week
* Oral presentation
* One Midterm, One Final

5.教學進度(Syllabus)
* Introduction: Thin Film Applications to Microelectronic Technology
* Thin film deposition and Surface energy
* Surface energy & Diffusion in solid
* Elastic stress & strain in thin film
* Introduction of reliability, FCT Reliability: metallurgical Reaction
* Interconnect Reliability: Electromigration in interconnect
* FCT reliability: Electromigration, thermomigration, stressmigration in FC
solder
* Packaging technology

6. 成績考核(Evaluation)
* Homework+class activity 25 %
* Midterm I: 30%
* Final: 25%
* Presentation 20%

7. 可連結之網頁位址 相關網頁(Personal Website)
eeclass數位學習系統: https://eeclass.nthu.edu.tw/