一、課程說明(Course Desc<x>ription)
<br>This course will examine in detail the modern Logic non-volalitile memory
<br>including device structure, process, reliability, design, characterization,
<br>qualification, application and IP.
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<br>二、指定用書(Text Books)
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<br>"Logic Non-Volatile Memory" by Charles Ching-Hsiang Hsu , World Scientific 2014.
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<br>三、參考書籍(References)
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<br>四、教學方式(Teaching Method)
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<br>Lecture.
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<br>五、教學進度(Syllabus)
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<br>1. Introduction to Logic non-volalitile memory.
<br>2. Review of Semiconductor Physics.
<br>3. Review of Semiconductor Device Physics.
<br>4. OTP Cell, Process Integration and Reliability.
<br>5. OTP Design.
<br>6. OTP ESD and Applications.
<br>7. FLASH Devices and Process Integration.
<br>8. FLASH P Reliability.
<br>9. FLASH Design.
<br>10. EEPROM Devices and Process Integration.
<br>11. EEPROM Design.
<br>12. OTP/FLASH/EEPROM Testing, Characterization and Qualification.
<br>13. NVM IP Foundry.
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<br>六、成績考核(Evaluation)
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<br>1. 六次作業或小考 ( 25% )
<br>2. 二次期中考 ( 25%/次 )
<br>3. 期末專題研究 (Term Project) ( 25% )
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