ob<x>jective:
<br>The purpose of this course is to provide students of engineering discipline an 
<br>overview of the basic properties, applications, and major types of semiconductors, 
<br>as well as characterization techniques employed in the analysis of semiconductor 
<br>materials.
<br>Textbook:
<br>1. W. F. Smith and J. Hashemi, "Foundations of Materials Science and Engineering", 
<br>6th Ed., McGraw-Hill, ISBN 978-1-260-09203-5
<br>2. B. G. Yacobi, "Semiconductor Materials: An Introduction to Basic Principles", 
<br>2003 Kluwer Academic/Plenum Publishers, ISBN 0-306-47361-5
<br>Teaching Method: Lecture
<br>Evaluation: Homework (20%), Quiz (20%), Midterm (30%), Final (30%)
<br>Outline
<br>1.	Basics of materials science (W1-W2)
<br>-	Mechanical properties of materials
<br>-	Electrical properties of materials
<br>-	Microstructures and phases
<br>2.	Crystal structure & defects in materials (W3-W4)
<br>-	Crystal structure
<br>-	Defects in solids
<br>3.	Materials in Silicon-ba<x>sed IC devices (W5-W7)
<br>-	Front-end-of-line materials
<br>-	Back-end-of-line materials
<br>-	Packaging materials
<br>Midterm Exam (W8)
<br>4.	Basic properties of Semiconductors (W9-W11)
<br>-	Energy bands of crystals
<br>-	Electrons/Hole carriers
<br>-	Intrinsic/Extrinsic semiconductors
<br>-	Recombination processes
<br>5.	Types of Semiconductors (W12-W13)
<br>-	Elemental semiconductors
<br>-	Compound semiconductors
<br>-	Oxide Semiconductors
<br>-	Organic semiconductors
<br>6.	Characterization of Semiconductors (W14-W16)
<br>-	Structural characterization
<br>-	Electrical characterization
<br>-	Optical characterization
<br>-	Surface characterization
<br>Final Exam (W17)
<br>Not applicable to AI
<br>