一,課程說明(Course Description)
This course aims to provide students with a comprehensive view of semiconductor
material and device charaterization techniques. After completing this course, the
students will be able to understand
the physics, the principles, and measurement methods for basic semiconductor
device characterizations.

二,指定用書(Text Books)

1. Dieter K Schroder, Semiconductor material and device characterization, Wiley
InterScience (Online service), 2006.

三,參考書籍(References)
None.

四,教學方式(Teaching Method)
Lecture in Chinese.

五,教學進度(Syllabus)
1. Resistivity(two weeks)
2. Carrier and Doping Density(two weeks)
3. Contact Resistance and Schottky Barriers(two weeks)
4. Series Resistance, Channel Length and Width, and Threshold Voltage(two weeks)
5. Defects(two weeks)
6. Oxide and Interface Trapped Charges, Oxide Thickness(two weeks)
7. Carrier Lifetimes(two weeks)
8. Mobility(two weeks)

六,成績考核(Evaluation)
To be determined

七,講義位址(http://)
elearn.nthu.edu.tw

八,本課程無涉及AI使用 Not applicable